Built-in self-test implementation on DLX microprocessor
Chip testing has always been a problem, especially nowadays that integrated circuits tend to become more complex. Testing using external equipment is usually expensive and time consuming. An approach that was used to alleviate this problem was to design the system with a built-in self-test (BIST). S...
| Prif Awdur: | |
|---|---|
| Awduron Eraill: | |
| Fformat: | Traethawd Ymchwil |
| Iaith: | English |
| Cyhoeddwyd: |
2008.
|
| Pynciau: |