Built-in self-test implementation on DLX microprocessor
Chip testing has always been a problem, especially nowadays that integrated circuits tend to become more complex. Testing using external equipment is usually expensive and time consuming. An approach that was used to alleviate this problem was to design the system with a built-in self-test (BIST). S...
| 主要作者: | |
|---|---|
| 其他作者: | |
| 格式: | Thesis |
| 語言: | English |
| 出版: |
2008.
|
| 主題: |