Recombination lifetime measurements in silicon - Gupta, D. C. (Dinesh C.).; Bacher, Fred R. 1955-.; Hughes, William M. 1948-. (West Conshohocken, PA ASTM, 1998)
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.
"STP 1340."
Includes bibliographical references and indexes.
Keywords: Semiconductors -- Testing -- Congresses; Service life (Engineering) -- Forecasting -- Congresses; Electronic measurements -- Congresses