Characterization of operational amplifiers implemented in a 90nm CMOS process
The scaling of transistor sizes is one of the major catalysts of technology development. However, smaller transistors exhibit higher order effects which requires us to use more complex models to accurately simulate their characteristics. We, at the Intel Microprocessors Laboratory, now have tools re...
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| Формат: | Диссертация |
| Язык: | English |
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2008.
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