Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

सभी संस्करण दिखाएं (2)
ग्रंथसूची विवरण
मुख्य लेखक: Bushnell, Michael L. (Michael Lee) 1950-
अन्य लेखक: Agrawal, Vishwani D. 1943-
स्वरूप: पुस्तक
भाषा:English
प्रकाशित: New York, N.Y. Springer c2000.
विषय:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
ऑनलाइन पहुंच:Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access