APA-referens (7:e uppl.)

Bushnell, M. L., & Agrawal, V. D. (2000). Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Springer.

Chicago-referens (17:e uppl.)

Bushnell, Michael L., och Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. New York, N.Y: Springer, 2000.

MLA-referens (9:e uppl.)

Bushnell, Michael L., och Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory, and Mixed-signal VLSI Circuits. Springer, 2000.