De Jong, A. F. Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces.
Chicago Style (17th ed.) CitationDe Jong, Alan Frank. Image Interpretation for Transmission Electron Microscopy of Thin Semiconductor Layers and Interfaces.
MLA (9th ed.) CitationDe Jong, Alan Frank. Image Interpretation for Transmission Electron Microscopy of Thin Semiconductor Layers and Interfaces.
Warning: These citations may not always be 100% accurate.