Tolansky, S. (1948). Multiple-beam interferometry of surfaces and films. Oxford at the Clarendon.
Cita Chicago (17th ed.)Tolansky, Samuel. Multiple-beam Interferometry of Surfaces and Films. Oxford: Oxford at the Clarendon, 1948.
Cita MLA (9th ed.)Tolansky, Samuel. Multiple-beam Interferometry of Surfaces and Films. Oxford at the Clarendon, 1948.
Atenció: Aquestes cites poden no estar 100% correctes.