Thermal stability study on titanium disilicide (TiSi2) thin films with titanium nitride (TiN) capping

Thermal stability study on titanium disilicide (TiSi2) thin films with titanium nitride (TiN) capping

Detalles Bibliográficos
Autor principal: Venezuela, Jeffrey De Guzman
Formato: Tesis
Lenguaje:English
Publicado: 2003.
Materias:
Titanium compounds > Thermal properties.
Silicon compounds > Thermal properties.
Titanium nitride.
Thin films > Testing.