Lanjouw, J. O., Pakes, A., & Putnam, J. How to count patents and value intellectual property: Uses of patent renewal and application data. National Bureau of Economic Research.
Chicago Style (17th ed.) CitationLanjouw, Jean O., Ariel Pakes, and Jonathan Putnam. How to Count Patents and Value Intellectual Property: Uses of Patent Renewal and Application Data. Cambridge, no.5741: National Bureau of Economic Research.
MLA (9th ed.) CitationLanjouw, Jean O., et al. How to Count Patents and Value Intellectual Property: Uses of Patent Renewal and Application Data. National Bureau of Economic Research.
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