APA(7版)引用形式

Lanjouw, J. O., Pakes, A., & Putnam, J. How to count patents and value intellectual property: Uses of patent renewal and application data. National Bureau of Economic Research.

Chicagoスタイル(17版)引用形式

Lanjouw, Jean O., Ariel Pakes, , Jonathan Putnam. How to Count Patents and Value Intellectual Property: Uses of Patent Renewal and Application Data. Cambridge, no.5741: National Bureau of Economic Research.

MLA(9版)引用形式

Lanjouw, Jean O., et al. How to Count Patents and Value Intellectual Property: Uses of Patent Renewal and Application Data. National Bureau of Economic Research.