The Test access port and boundary scan architecture

The Test access port and boundary scan architecture

Detaylı Bibliyografya
Materyal Türü: Kitap
Dil:English
Baskı/Yayın Bilgisi: Los Alamitos, Calif. IEEE Computer Society Press c1990.
Konular:
Boundary scan testing.
Computer architecture.
Electronic circuits > Testing > Data processing.