Analog signal generation for built-in-self-test of mixed-signal integrated circuits

Analog signal generation for built-in-self-test of mixed-signal integrated circuits

Opis bibliograficzny
1. autor: Roberts, Gordon W., 1959-
Kolejni autorzy: Lu, Albert K., 1969-
Format: Książka
Język:English
Wydane: Boston Kluwer Academic Publishers c1995.
Hasła przedmiotowe:
Integrated circuits > Design and construction.
Integrated circuits > Testing.
Signal generators > Design and construction.
Signal processing > Digital techniques.