Statistical approach to VLSI

Statistical approach to VLSI

Bibliographische Detailangaben
Weitere Verfasser: Director, Stephen W., Maly, W.
Format: Buch
Sprache:English
Veröffentlicht: Amsterdam North-Holland 1994.
Schriftenreihe:Advances in CAD for VLSI v. 8
Schlagworte:
Integrated circuits > Very large scale integration > Defects.
Integrated circuits > Very large scale integration > Design and construction > Statistical methods.
Mathematical optimization.