Test economics and design for testability for electronic circuits and systems

Test economics and design for testability for electronic circuits and systems

Opis bibliograficzny
Kolejni autorzy: Dislis, C. (Chryssa)
Format: Książka
Język:English
Wydane: New York Ellis Horwood c1995.
Hasła przedmiotowe:
Electronic circuits > Testing.
Electronic circuit design > Economic aspects.