Hot-carrier effects in MOS devices

Bibliografski detalji
Glavni autor:	Takeda, Eiji 1944-
Daljnji autori:	Yang, C. Y.-W. 1948- (Cary Y. -W.), Miura-Hamada, Akemi
Format:	Knjiga
Jezik:	English
Izdano:	San Diego Academic Press c1995.
Teme:	Metal oxide semiconductors. Hot carriers.