Hot-carrier effects in MOS devices

Detalles Bibliográficos
Autor Principal:	Takeda, Eiji 1944-
Outros autores:	Yang, C. Y.-W. 1948- (Cary Y. -W.), Miura-Hamada, Akemi
Formato:	Libro
Idioma:	English
Publicado:	San Diego Academic Press c1995.
Subjects:	Metal oxide semiconductors. Hot carriers.