APA (7th ed.) Citation

Takeda, E., Yang, C. Y., & Miura-Hamada, A. (1995). Hot-carrier effects in MOS devices. Academic Press.

Chicago Style (17th ed.) Citation

Takeda, Eiji, C. Y.-W Yang, and Akemi Miura-Hamada. Hot-carrier Effects in MOS Devices. San Diego: Academic Press, 1995.

MLA (9th ed.) Citation

Takeda, Eiji, et al. Hot-carrier Effects in MOS Devices. Academic Press, 1995.