Manufacturing yield evaluation of VLSI/WSI systems

Xehetasun bibliografikoak
Beste egile batzuk:	Ciciani, Bruno
Formatua:	Liburua
Hizkuntza:	English
Argitaratua:	Los Alamitos, California IEEE Computer Society Press c1995.
Gaiak:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Integrated circuits > Fault tolerance.