Manufacturing yield evaluation of VLSI/WSI systems

Manufacturing yield evaluation of VLSI/WSI systems

Detalles Bibliográficos
Outros autores: Ciciani, Bruno
Formato: Libro
Idioma:English
Publicado: Los Alamitos, California IEEE Computer Society Press c1995.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Wafer-scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Reliability.
Integrated circuits > Wafer-scale integration > Reliability.
Integrated circuits > Fault tolerance.