Manufacturing yield evaluation of VLSI/WSI systems

Détails bibliographiques
Autres auteurs:	Ciciani, Bruno
Format:	Livre
Langue:	English
Publié:	Los Alamitos, California IEEE Computer Society Press c1995.
Sujets:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Integrated circuits > Fault tolerance.