Manufacturing yield evaluation of VLSI/WSI systems

Manylion Llyfryddiaeth
Awduron Eraill:	Ciciani, Bruno
Fformat:	Llyfr
Iaith:	English
Cyhoeddwyd:	Los Alamitos, California IEEE Computer Society Press c1995.
Pynciau:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Integrated circuits > Fault tolerance.