Manufacturing yield evaluation of VLSI/WSI systems

Manufacturing yield evaluation of VLSI/WSI systems

Λεπτομέρειες βιβλιογραφικής εγγραφής
Άλλοι συγγραφείς: Ciciani, Bruno
Μορφή: Βιβλίο
Γλώσσα:English
Έκδοση: Los Alamitos, California IEEE Computer Society Press c1995.
Θέματα:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Wafer-scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Reliability.
Integrated circuits > Wafer-scale integration > Reliability.
Integrated circuits > Fault tolerance.