Ciciani, B. (1995). Manufacturing yield evaluation of VLSI/WSI systems. IEEE Computer Society Press.
Citación estilo ChicagoCiciani, Bruno. Manufacturing Yield Evaluation of VLSI/WSI Systems. Los Alamitos, California: IEEE Computer Society Press, 1995.
Cita MLACiciani, Bruno. Manufacturing Yield Evaluation of VLSI/WSI Systems. IEEE Computer Society Press, 1995.
Warning: These citations may not always be 100% accurate.