Ciciani, B. (1995). Manufacturing yield evaluation of VLSI/WSI systems. IEEE Computer Society Press.
Cita Chicago (17th ed.)Ciciani, Bruno. Manufacturing Yield Evaluation of VLSI/WSI Systems. Los Alamitos, California: IEEE Computer Society Press, 1995.
Cita MLA (9th ed.)Ciciani, Bruno. Manufacturing Yield Evaluation of VLSI/WSI Systems. IEEE Computer Society Press, 1995.
Atenció: Aquestes cites poden no estar 100% correctes.