Electron beam testing technology

Sonraí bibleagrafaíochta
Rannpháirtithe:	Thong, John T. L.
Formáid:	LEABHAR
Teanga:	English
Foilsithe / Cruthaithe:	New York Plenum Press c1993.
Ábhair:	Electron beams > Industrial applications. Scanning electron microscopes. Semiconductors > Testing.