00000cam a22000004a 4500 UP-99796217603051530 Buklod 20230503092542.0 a grb 001 u| ta 080209s xx r |000 u|eng d 0818636920 (iLib)UPD-00000175921 DENG eng TA 1634 I33 1993 IEEE workshop on qualitative vision proceedings, June 14, 1993 New York, New York sponsored by IEEE Computer Society Technical committee on Pattern Analysis and Machine Intelligence. IEEE Computer Society Technical Committee on Pattern Analysis and Machine Los Alamitos IEEE computer Society Press, c1993 vi, 151 p. Computer vision--Congresses. Book FO Monograph UPD DENG TA 1634 I33 1993 Book