Analysis of microelectronic materials and devices

Détails bibliographiques
Autres auteurs:	Grasserbauer, M. (Manfred) 1945-, Werner, H. W.
Format:	Livre
Langue:	English
Publié:	Chichester Wiley c1991.
Sujets:	Microelectronics > Materials > Testing. Microelectronics > Testing. Microstructure.