APA (7th ed.) Citation

Strausser, Y. (1993). Characterization in silicon processing. Butterworth-Heinemann.

Chicago Style (17th ed.) Citation

Strausser, Yale. Characterization in Silicon Processing. Boston: Butterworth-Heinemann, 1993.

MLA (9th ed.) Citation

Strausser, Yale. Characterization in Silicon Processing. Butterworth-Heinemann, 1993.

Warning: These citations may not always be 100% accurate.