Parametric study of adhesive joints by using the probabilistic finite element approach

The thermal stresses in adhesive joints due to the large difference in thermal expansion between dissimilar materials presenting in adhesive electronic packages is the source of a major problem to be solved in order to achieve improved reliability. However, because of the shortage of the facilitated...

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書目詳細資料
主要作者: Chen, Weixu
格式: Thesis
語言:English
出版: 2006.
主題: