Parametric study of adhesive joints by using the probabilistic finite element approach

The thermal stresses in adhesive joints due to the large difference in thermal expansion between dissimilar materials presenting in adhesive electronic packages is the source of a major problem to be solved in order to achieve improved reliability. However, because of the shortage of the facilitated...

詳細記述

書誌詳細
第一著者: Chen, Weixu
フォーマット: 学位論文
言語:English
出版事項: 2006.
主題: