Parametric study of adhesive joints by using the probabilistic finite element approach

The thermal stresses in adhesive joints due to the large difference in thermal expansion between dissimilar materials presenting in adhesive electronic packages is the source of a major problem to be solved in order to achieve improved reliability. However, because of the shortage of the facilitated...

תיאור מלא

מידע ביבליוגרפי
מחבר ראשי: Chen, Weixu
פורמט: Thesis
שפה:English
יצא לאור: 2006.
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