Terman, L. M., & Merrill, M. A. (1937). Measuring intelligence: A guide to the administration of the new revised Stanford-Binet tests of intelligence. Houghton Mifflin company.
Style de citation Chicago (17e éd.)Terman, Lewis Madison, et Maud Amanda Merrill. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Boston, New York: Houghton Mifflin company, 1937.
Style de citation MLA (9e éd.)Terman, Lewis Madison, et Maud Amanda Merrill. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Houghton Mifflin company, 1937.
Attention : ces citations peuvent ne pas être correctes à 100%.