00000cam a22000004a 4500 UP-8027390931316230470 Buklod 20140507162423.0 a r |||| u| ta 891216s1988 dcua rb |001 0|eng d 081868786X 0818647868 (microfiche) (iLib)UPMIN-00007089267 DLC DLC DLC TK7874 T8857 1988 621.39.5.0287 20 TK7874 T8857 1988 Tutorial test generation for VLSI chips [edited by] Vishwani D. Agrawal and Sharad C. Seth. Washington, D.C. Computer Society Press Los Angeles, CA Order from Computer Society c1988. x, 401 p. ill. 29 cm. "Computer Society order number 786." "IEEE catalog number EH0278-2." Includes index. Bibliography: p. 333-394. Integrated circuits Very large scale integration Testing. Automatic test equipment. Agrawal, Vishwani D. 1943-. Seth, Sharad C. IEEE Computer Society. Test generation for VLSI chips. UPMIN UPMIN-MAIN TK7874 T8857 1988 Book