Tutorial test generation for VLSI chips - Agrawal, Vishwani D. 1943-.; Seth, Sharad C.; IEEE Computer Society (Washington, D.C. Computer Society Press Los Angeles, CA Order from Computer Society, 1988)
"Computer Society order number 786."
"IEEE catalog number EH0278-2."
Includes index.
Bibliography: p. 333-394.
Keywords: Integrated circuits -- Very large scale integration -- Testing; Automatic test equipment