00000nam a22000007i 4500 UP-8027390931311709650 Buklod 20250307143838.0 m |o d | cr ||||||||||| 250307s2021 xx u eng 9783030692094 (eBook) (Buklod)UP-8027295163992815161 DLC DENGII rda eng TK 7874 H84 2021eb Huhn, Sebastian author. Design for testability, debug and reliability next generation measures using formal techniques Sebastian Huhn , Rolf Drechsler. Switzerland Springer [2021] 1 online resource. text txt rdacontent computer rdamedia online resource nc rdacarrier IP based subscription, on campus and remote access Access via Electronic Resources of the UPD Engineering Library and University Library websites. This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications. Electronic reproduction Switzerland Springer 2021 Available via World Wide Web through SpringerLink. Integrated circuits Design and construction. Integrated circuits Reliability. Integrated circuits Testing. Debugging in computer science. Electronic books. Drechsler, Rolf author. Also available remotely for the University of the Philippines System via SpringerLink. Click here to access thru EZproxy https://link-springer-com.ezproxy.engglib.upd.edu.ph/book/10.1007/978-3-030-69209-4 Available for University of the Philippines System via SpringerLink. Click here to access https://doi.org/10.1007/978-3-030-69209-4 FO UPD DENG-II TK 7874 H84 2021eb Electronic Resource