00000cam a22000003i 4500 UP-1685594773862075042 Buklod 20170228145638.0 g||| | || || ta 170522s2015 nyua rb |||| u|eng d 9781632384096 (hbk.) (iLib)UPBAG-00023453582 BC-67754 JNJ Educational Enterprises Php5,822.10 DPS Faculty OCLC BAG rda eng QH 212 A78 S35 2015 Scientific researches in atomic force microscopy edited by Kate Wright. New York, NY, USA NY Research Press ©2015. vi, 260 pages illustrations (some color) 24 cm Includes bibliographical references. This book elucidates the scientific researches in the field of atomic force microscopy. The invention of the atomic force microscope (AFM) brought about drastic changes in the field of surface analysis. It proved to be a critical investigative resource and method, used for qualitative and quantitative study of surfaces with sub-nanometer resolutions. Additionally, samples analyzed through this microscope don't need prior preparation procedures. This prevents any alterations or adverse effects which may damage the sample while allowing a three dimensional study of the exterior surface. This book presents latest work by masters of this method across the globe. This method has found ready acceptance in procuring important information in a diverse spectrum of fields. Since its inception in 1986, it has found multiple uses across manufacturing, research and advancement fields. Atomic force microscopy Research. Wright, Kate editor. FO UPBAG UPBAG-MAIN QH 212 A78 S35 2015 Book