Integrated circuit failure analysis a guide to preparation techniques - Beck, Friedrich; Wilson S. Stephen (New York Wiley, 1997)
"Revised edition of Praparationstechniken fur die Fehleranalyse an integrierten Halbleiterschaltungen, VCH Verlagsgesellschaft mbH, 1988"--Title page verso.
Includes bibliographical references and index.
Keywords: Semiconductors -- Testing; Semiconductors -- Testing