Terman, L. M., & Merrill, M. A. (1937). Measuring intelligence: A guide to the administration of the new revised Stanford-Binet tests of intelligence. Houghton Mifflin.
Cita Chicago Style (17a ed.)Terman, Lewis Madison, y Maud A. Merrill. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Boston: Houghton Mifflin, 1937.
Cita MLA (9a ed.)Terman, Lewis Madison, y Maud A. Merrill. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Houghton Mifflin, 1937.
Precaución: Estas citas no son 100% exactas.