Thermal stability study on titanium disilicide (tisi2) thin films with titanium nitride (tin) capping using atomic force microscopy

Detalles Bibliográficos
Publicado en:Philippine Engineering Journal Vol. 23, no. 2 (2002), 49-62
Autor Principal: Venezuela, Jeffrey DG
Outros autores: Amorsolo, Jr. Albert V.
Formato: Artigo
Idioma:English
Publicado: 2002
Subjects: