TY  - JOUR
T1  - Analysis of crack propagation under different die tilt configuration on a small outline transistor
JF  - Philippine Engineering Journal
A1  - Callanga, Jennifer F.
A2  - Macaspac, Hannah Erika
A2  - Danao, Louis Angelo M.
A2  - Mena, Manolo
LA  - English
YR  - 2020
UL  - https://tuklas.up.edu.ph/Record/IPP-00000635561
KW  - Crack propagation (Fracture mechanics)
KW  - ANSYS (Computer system)
KW  - Power transistors
ER  -