Dangos 1 - 1 canlyniadau o 1 ar gyfer chwilio 'Voyiatzis, I.', amser ymholiad: 0.01e Mireinio'r Canlyniadau
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    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. gan Voyiatzis, I.

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    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time.

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