Mitigating process variability and soft errors at circuit-level for FinFETs 由 Zimpeck, Alexandra, Meinhardt, Cristina, Artola, Laurent, Reis, Ricardo

Also available remotely for the University of the Philippines System via SpringerLink. Click here to access thru EZproxy
Available for University of the Philippines System via SpringerLink. Click here to access

Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS 由 Posser, Gracieli, Sapatnekar, Sachin S. 1967-, Reis, Ricardo

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Circuit design for reliability

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Sticky information versus sticky prices a proposal to replace the new Keynesian Phillips curve 由 Mankiw, N. Gregory