Showing 1 - 6 results of 6 for search 'Pomeranz, I.', query time: 0.01s
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Fault isolation for nonisolated blocks. by Pomeranz, I.
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Fault isolation for nonisolated blocks. by Pomeranz, I.
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3
Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. by Pomeranz, I.
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4
Test enrichment for path delay faults using multiple sets of target faults. by Pomeranz, I.
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5
On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. by Pomeranz, I.
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6
Autoscan a scan design without external scan inputs or outputs. by Pomeranz, I.
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