Résultat(s) 1 - 6 résultats de 6 pour la requête 'Pomeranz, I.', Temps de recherche: 0,01s Affiner les résultats
  1. 1

    Fault isolation for nonisolated blocks. par Pomeranz, I.

    Article

    Fault isolation for nonisolated blocks.
  2. 2

    Fault isolation for nonisolated blocks. par Pomeranz, I.

    Article

    Fault isolation for nonisolated blocks.
  3. 3

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. par Pomeranz, I.

    Article

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  4. 4

    Test enrichment for path delay faults using multiple sets of target faults. par Pomeranz, I.

    Article

    Test enrichment for path delay faults using multiple sets of target faults.
  5. 5

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. par Pomeranz, I.

    Article

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.
  6. 6

    Autoscan a scan design without external scan inputs or outputs. par Pomeranz, I.

    Article

    Autoscan a scan design without external scan inputs or outputs.

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