Отображение 1 - 6 результаты of 6 для поиска 'Pomeranz, I.', время запроса: 0.01сек. Отмена результатов
  1. 1

    Fault isolation for nonisolated blocks. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Fault isolation for nonisolated blocks.
  2. 2

    Fault isolation for nonisolated blocks. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Fault isolation for nonisolated blocks.
  3. 3

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  4. 4

    Test enrichment for path delay faults using multiple sets of target faults. по Pomeranz, I.

    Статья

    Test enrichment for path delay faults using multiple sets of target faults.
  5. 5

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. по Pomeranz, I.

    Статья

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.
  6. 6

    Autoscan a scan design without external scan inputs or outputs. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Autoscan a scan design without external scan inputs or outputs.

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