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    Mitigating process variability and soft errors at circuit-level for FinFETs Por Zimpeck, Alexandra, Meinhardt, Cristina, Artola, Laurent, Reis, Ricardo

    Publicado em 2021
    Also available remotely for the University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Available for University of the Philippines System via SpringerLink. Click here to access
    Electronic Resource

    Mitigating process variability and soft errors at circuit-level for FinFETs

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