Showing 1 - 1 results of 1 for search 'Loukianova, N.V', 查詢時間: 0.01s Refine Results
  1. 1

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. 由 Loukianova, N.V

    Article

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors.

檢索工具: