Showing 1 - 1 results of 1 for search 'Loukianova, N.V', tempo de consulta: 0.01s Limitar resultados
  1. 1

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors. por Loukianova, N.V

    Artigo

    Leakage current modeling of test structures for characterization of dark current in CMOS image sensors.

Ferramentas de procura: