Showing 1 - 10 results of 17 for search 'Lau, John H.', tempo de consulta: 0.01s
Limitar resultados
-
1
Semiconductor advanced packaging por Lau, John H.
Publicado 2021Número de Clasificación: loading...Ligazón do recurso
Situado: loading...
Ligazón do recurso
Electronic Resource -
2
Assembly and reliability of lead-free solder joints por Lau, John H., Lee, Ning-Cheng
Publicado 2020Número de Clasificación: loading...Available for University of the Philippines Diliman via SpringerLink. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy
Electronic Resource -
3
Heterogeneous integrations por Lau, John H.
Publicado 2019Número de Clasificación: loading...Available for University of the Philippines Diliman via SpringerLink. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy
Electronic Resource -
4
Fan-out wafer-level packaging por Lau, John H.
Publicado 2018Número de Clasificación: loading...Available for University of the Philippines System via SpringerLink. Click here to access
Situado: loading...
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
Electronic Resource -
5
3D IC integration and packaging por Lau, John H.
Publicado 2016Número de Clasificación: loading...Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy
Electronic Resource -
6
Through-silicon vias for 3D integration por Lau, John H.
Publicado 2013Número de Clasificación: loading...Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy
Electronic Resource -
7
Reliability of RoHS-Compliant 2D and 3D IC interconnects por Lau, John H.
Publicado 2011Número de Clasificación: loading...Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy
Electronic Resource -
8
Advanced MEMS packaging
Publicado 2010Número de Clasificación: loading...Also available online for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
Situado: loading...
Libro -
9
Advanced MEMS packaging
Publicado 2010Número de Clasificación: loading...Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy
Electronic Resource -
10
Electronics manufacturing with lead-free, halogen-free, and conductive-adhesive materials
Publicado 2003Número de Clasificación: loading...Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
Situado: loading...
Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy
Electronic Resource
Ferramentas de procura:
Materias Relacionadas
Electronic books
Microelectronic packaging
Design and construction
Electronic packaging
Integrated circuits
Microelectromechanical systems
Semiconductors
Surface mount technology
Three-dimensional integrated circuits
Ball grid array technology
Cost control
Electronic apparatus and appliances
Electronic circuit design
Electronic circuits
Electronics
Engineering
Environmental protection
Fine pitch technology
Green electronics
Green technology
Interconnects (Integrated circuit technology)
Junctions
Microelectronics
Optical materials
Printed circuits
Reliability
Systems engineering
Thermal stresses


