Showing 1 - 2 results of 2 for search 'Lanzerotti, M.Y', query time: 0.01s
Refine Results
-
1
Assessment of on-chip wire-length distribution models. by Lanzerotti, M.Y
Published in IEEE Transactions on VLSI systemsCall Number: loading...
Located: loading...Article loading... -
2
Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models. by Lanzerotti, M.Y
Published in IEEE Transactions on VLSI systemsCall Number: loading...
Located: loading...Article loading...