Mostrando 1 - 1 resultados de 1 para a busca 'Jih-Jeen Chen', tempo de busca: 0.01s Refinar Resultados
  1. 1

    Test pattern generation and clock disabling for simultaneous test time and power reduction. por Jih-Jeen Chen

    Artigo

    Test pattern generation and clock disabling for simultaneous test time and power reduction.

Ferramentas de busca: