Erakusten 1 - 1 emaitzak -- 1 bilaketa honetara 'Jih-Jeen Chen', Bilaketaren denbora: 0,01s Findu emaitzak
  1. 1

    Test pattern generation and clock disabling for simultaneous test time and power reduction. nork Jih-Jeen Chen

    Artikulua

    Test pattern generation and clock disabling for simultaneous test time and power reduction.

Bilaketa egiteko lanabesak: