Dangos 1 - 1 canlyniadau o 1 ar gyfer chwilio 'Jih-Jeen Chen', amser ymholiad: 0.01e Mireinio'r Canlyniadau
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    Test pattern generation and clock disabling for simultaneous test time and power reduction. gan Jih-Jeen Chen

    Erthygl

    Test pattern generation and clock disabling for simultaneous test time and power reduction.

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