Showing 1 - 1 results of 1 for search 'Head, A. K.', זמן שאילתה: 0.01s Refine Results
  1. 1

    Computed electron micrographs and defect identification

    יצא לאור 1973
    Available for University of the Philippines System via ScienceDirect. Click here to access
    Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy
    Electronic Resource

    Computed electron micrographs and defect identification

כלי חיפוש: