Mostrar 1 - 2 resultats de 2 per cerca 'Cherns, David', hora de la petició: 0.01sec
Refinar resultats
-
1
Electron microscopy and analysis 1995 proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Birmingham, 12-15 September 1995 Inst...
Publicat 1995Signatura: loading...
Localitzat: loading...Llibre loading... -
2
Evaluation of advanced semiconductor materials by electron microscopy
Publicat 1989Signatura: loading...
Localitzat: loading...Llibre loading...