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  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. per Chandra, A.

    Article

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    System-on-a-chip test-data compression and decompression architectures based on Golomb codes. per Chandra, A.

    Article

    System-on-a-chip test-data compression and decompression architectures based on Golomb codes.

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