Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits 由 Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits 由 Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

VLSI design proceedings of the Second International Workshop on VLSI Design ; Bangalore, India, December 15-18, 1988

Tutorial test generation for VLSI chips